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Correspondence between AXAF TMA X-ray performance and models based upon mechanical and visible light measurementsThe AXAF Technology Mirror Assembly (TMA) was characterized prior to X-ray testing by properties measured mechanically or with visible light; these include alignment offsets, roundness and global-axial-slope errors, axial-figure errors with characteristic lengths greater than about five mm, and surface roughness with scale lengths between about 0.005 and 0.5 mm. The X-ray data of Schwartz et al. (1985) are compared with predictions based upon the mechanical and visible light measurements.
Document ID
19870032451
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Van Speybroeck, L.
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Mckinnon, P. J.
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Murray, S. S.
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Primini, F. A.
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Schwartz, D. A.
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Zombeck, M. V.
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Dailey, C. C.
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Reily, J. C.
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Weisskopf, M. C.
(Smithsonian Astrophysical Observatory Cambridge, MA, United States)
Wyman, C. L.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 13, 2013
Publication Date
January 1, 1986
Subject Category
Optics
Accession Number
87A19725
Distribution Limits
Public
Copyright
Other

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