CCD advances for X-ray scientific measurements in 1985A theoretical model is presented which predicts the output response of a CCD to soft X-ray spectra. The model simulates the four fundamental parameters that ultimately limit CCD performance: quantum efficiency, charge collection efficiency, charge transfer efficiency, and read noise. Simulated results are presented for a wide variety of CCD structures, and general conclusions are presented about achieving a practical balance of sensitivity, energy, and spatial resolution for an AXAF instrument. The results of the analysis are compared to an existing state-of-the art CCD and improvements which will be made in the near future are projected.
Document ID
19870032493
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Janesick, James (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Elliott, Tom (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Collins, Stewart (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Daud, Taher (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Campbell, Dave (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Dingizian, Arsham (California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)