Crystalline-silicon reliability lessons for thin-film modules

Key reliability and engineering lessons learned from the 10-year history of the Jet Propulsion Laboratory's Flat-Plate Solar Array Project are presented and analyzed. Particular emphasis is placed on lessons applicable to the evolving new thin-film cell and module technologies and the organizations involved with these technologies. The user-specific demand for reliability is a strong function of the application, its location, and its expected duration. Lessons relative to effective means of specifying reliability are described, and commonly used test requirements are assessed from the standpoint of which are the most troublesome to pass, and which correlate best with field experience. Module design lessons are also summarized, including the significance of the most frequently encountered failure mechanisms and the role of encapsulant and cell reliability in determining module reliability. Lessons pertaining to research, design, and test approaches include the historical role and usefulness of qualification tests and field tests.