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1986 Annual Conference on Nuclear and Space Radiation Effects, 23rd, Providence, RI, July 21-23, 1986, ProceedingsThe present conference on the effects of nuclear and space radiation on electronic hardware gives attention to topics in the basic mechanisms of radiation effects, dosimetry and energy-dependent effects, electronic device radiation hardness assurance, SOI/SOS radiation effects, spacecraft charging and space radiation, IC radiation effects and hardening, single-event upset (SEU) phenomena and hardening, and EMP/SGEMP/IEMP phenomena. Specific treatments encompass the generation of interface states by ionizing radiation in very thin MOS oxides, the microdosimetry of meson energy deposited on 1-micron sites in Si, total dose radiation and engineering studies, plasma interactions with biased concentrator solar cells, the transient imprint memory effect in MOS memories, mechanisms leading to SEU, and the vaporization and breakdown of thin columns of water.
Document ID
19870034702
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Ellis, Thomas D.
(U.S. Navy, Naval Weapons Support Center Crane, IN, United States)
Date Acquired
August 13, 2013
Publication Date
December 1, 1986
Publication Information
ISSN: 0018-9499
Subject Category
Electronics And Electrical Engineering
Accession Number
87A21976
Distribution Limits
Public
Copyright
Other

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