The Galileo single-event upset solution and risk assessmentThe Galileo probe will be subject to radiation fields and energetic particle bombardment during its outward bound journey and in orbit around Jupiter and its moons. To avoid the occurrence and propagation of effects of single event upset (SEU) bit state changes induced by the bombardments attempts were made to harden the Galileo electronics against SEUs. The hazards are especially acute for Schottky diode and low-power Schottky TTL parts. The preventive action options which were scheduled are reviewed, noting the selection of CMOS chips as replacements for SEU-susceptible devices. The simulation and risk assessment that were performed to evaluate the potential success of the replacements are summarized, with emphasis on the data employed to ensure the accuracy of the assessments and the predicted effects of SEUs in the various Galileo subsystems.
Document ID
19870045464
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Burdick, Garry M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Kopf, Edward H. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Meyer, Donald D. (California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)