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Low reflectance EUV materials - A comparative studyA study has been undertaken of the performance characteristics of a variety of surfaces and surface treatments for use on baffle materials in Extreme UV Explorer instrumentation, in order to ascertain which materials performed with the least overall scattering between 300 and 1200 A and thereby minimize this important background source. Seven scattering samples were measured: bead-blasted aluminum treated with alodine 600, bead-blasted aluminum, Kel-f, etched molybdenum, nickel-plated etched molybdenum, bead-blasted 304 stainless steel, and bead-blasted aluminum painted with Chemglaze Z-306. Attention is given to total reflectance of each material plotted against the graze angle for 304, 584, and 1216 A.
Document ID
19870045691
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Jelinsky, Patrick
(California Univ. Berkeley, CA, United States)
Jelinsky, Sharon
(California, University Berkeley, United States)
Date Acquired
August 13, 2013
Publication Date
February 15, 1987
Publication Information
Publication: Applied Optics
Volume: 26
ISSN: 0003-6935
Subject Category
Optics
Accession Number
87A32965
Funding Number(s)
CONTRACT_GRANT: NAS5-29298
Distribution Limits
Public
Copyright
Other

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