Variations in the polarized leaf reflectance of Sorghum bicolor

The polarized reflectance factor, Rq, of sorghum (Sorghum bicolor, L.) leaves from field-grown plants was measured in situ in the summers of 1983 and 1984. In 1983, three leaves of two randomly selected plants were measured at 2-week intervals. The value of Rq varied, depending on leaf and day of measurement. Measured values of Rq for the adaxial leaf surface ranged from 16 to 53; for the abaxial leaf surface the values ranged from 28 to 69. In 1984, measurements consisted of repeated observations made on the same leaf at biweekly intervals. The values of Rq from the adaxial leaf surface ranged from 26 to 38. Values of Rq from the abaxial leaf surface increased throughout the season, from 16 to 45. Differences in Rq were attributed to changes in surface details of the leaf.