Constrained sheath optics for high thrust density, low specific impulse ion thrusters

The results of an experimental study showing that a contoured, fine wire mesh attached to the screen grid can be used to control the divergence characteristics of ion beamlets produced at low net-to-total accelerating voltage ratios are presented. The influence of free and constrained-sheath optics systems on beamlet divergence characteristics are found to be similar in the operating regime investigated, but it was found that constrained-sheath optics systems can be operated at higher perveance levels than free-sheath ones. The concept of a fine wire interference probe that can be used to study ion beamlet focusing behavior is introduced. This probe is used to demonstrate beamlet focusing to a diameter about one hundreth of the screen grid extraction aperture diameter. Additional testing is suggested to define an optimally contoured mesh that could yield well focused beamlets at net-to-total accelerating voltage ratios below about 0.1.