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Fracture of flash oxidized, yttria-doped sintered reaction-bonded silicon nitrideThe oxidation behavior of a slip cast, yttria-doped, sintered reaction-bonded silicon nitride after 'flash oxidation' was investigated. It was found that both the static oxidation resistance and flexural stress rupture life (creep deformation) were improved at 1000 C in air compared to those of the same material without flash oxidation. Stress rupture data at high temperatures (1000 to 1200 C) are presented to indicate applied stress levels for oxidation-dependent and independent failures.
Document ID
19870060649
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
doi:10.1007/BF01233108
Authors
Govila, R. K. (Ford Motor Co. Dearborn, MI, United States)
Date Acquired
August 13, 2013
Publication Date
April 1, 1987
Publication Information
Publication: Journal of Materials Science
Volume: 22
ISSN: 0022-2461
Subject Category
Nonmetallic Materials
Accession Number
87A47923
Funding Number(s)
CONTRACT_GRANT: DEN3-167
CONTRACT_GRANT: NASA ORDER P-192815-D
Distribution Limits
Public
Copyright
Other

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