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NDE reliability and process control for structural ceramicsThe reliability of microfocus X-radiography and scanning laser acoustic microscopy for detecting microvoids in silicon nitride and silicon carbide was statistically evaluated. Materials- and process-related parameters that influenced the statistical findings in research samples are discussed. The use of conventional X-radiography in controlling and optimizing the processing and sintering of an Si3N4-SiO2-Y2O3 composition designated NASA 6Y is described. Radiographic evaluation and guidance helped develop uniform high-density Si3N4 modulus-of-rupture bars with improved four-point flexural strength (857, 544, and 462 MPa at room temperature, 1200 C, and 1370 C, respectively) and reduced strength scatter.
Document ID
19870061428
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Baaklini, G. Y.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 13, 2013
Publication Date
July 1, 1987
Publication Information
Publication: ASME, Transactions, Journal of Engineering for Gas Turbines and Power
Volume: 109
ISSN: 0022-0825
Subject Category
Quality Assurance And Reliability
Report/Patent Number
ASME PAPER 87-GT-8
Accession Number
87A48702
Distribution Limits
Public
Copyright
Other

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