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charge-coupled-device x-ray detector performance modelA model that predicts the performance characteristics of CCD detectors being developed for use in X-ray imaging is presented. The model accounts for the interactions of both X-rays and charged particles with the CCD and simulates the transport and loss of charge in the detector. Predicted performance parameters include detective and net quantum efficiencies, split-event probability, and a parameter characterizing the effective thickness presented by the detector to cosmic-ray protons. The predicted performance of two CCDs of different epitaxial layer thicknesses is compared. The model predicts that in each device incomplete recovery of the charge liberated by a photon of energy between 0.1 and 10 keV is very likely to be accompanied by charge splitting between adjacent pixels. The implications of the model predictions for CCD data processing algorithms are briefly discussed.
Document ID
19870065197
Document Type
Reprint (Version printed in journal)
Authors
Bautz, M. W.
(Massachusetts Inst. of Tech. Cambridge, MA, United States)
Berman, G. E.
(Massachusetts Inst. of Tech. Cambridge, MA, United States)
Doty, J. P.
(Massachusetts Inst. of Tech. Cambridge, MA, United States)
Ricker, G. R.
(MIT Cambridge, MA, United States)
Date Acquired
August 13, 2013
Publication Date
August 1, 1987
Publication Information
Publication: Optical Engineering
Volume: 26
ISSN: 0091-3286
Subject Category
INSTRUMENTATION AND PHOTOGRAPHY
Funding Number(s)
CONTRACT_GRANT: NSG-7643
CONTRACT_GRANT: NAS8-36749
Distribution Limits
Public
Copyright
Other