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Automatically Inspecting Thin Ceramics For PinholesProposed apparatus for inspecting prefired ceramic materials detects minute flaws that might escape ordinary visual inspections. Method detects flaws and marks locations. Intended for such thin ceramic parts as insulation in capacitors and some radio-frequency filters.
Document ID
19880000020
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Honaker, James R. (Rockwell International Corp.)
Date Acquired
August 13, 2013
Publication Date
January 1, 1988
Publication Information
Publication: NASA Tech Briefs
Volume: 12
Issue: 1
ISSN: 0145-319X
Subject Category
Electronic Systems
Report/Patent Number
MSC-21091
Accession Number
88B10020
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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