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Optimization of Processing of Si3N4Process changes iterated under guidance of x-radiography. In recent work at NASA Lewis Research Center, density gradients in sintered silicon nitride, characterized by x-radiography, identified and appeared strongly dependent upon powder-processing and sintering conditions. NASA technical memorandum describes systematic investigation, based upon preliminary work, of density-gradient/flexural-strength relationships as affected by processing.
Document ID
19880000033
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Sanders, William A. (NASA Lewis Research Center, Cleveland, Ohio.)
Baaklini, George Y. (NASA Lewis Research Center, Cleveland, Ohio.)
Date Acquired
August 13, 2013
Publication Date
January 1, 1988
Publication Information
Publication: NASA Tech Briefs
Volume: 12
Issue: 1
ISSN: 0145-319X
Subject Category
Materials
Report/Patent Number
LEW-14456
Accession Number
88B10033
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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