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System Measures Logic-Gate DelaysMany gates on chip tested automatically. Automatic testing system measures signal-propagation delays of experimental integrated-circuit array of logic gates. Includes controlling computer, counter/time, and feedback-controlled timing-waveform generator. Multiplexer included on integrated-circuit chip with logic-gate array to be tested. Delays measured by system serve as valuable data for design of fast logic and memory chips.
Document ID
19880000331
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Blaes, Brent R.
(Caltech)
Date Acquired
August 13, 2013
Publication Date
June 1, 1988
Publication Information
Publication: NASA Tech Briefs
Volume: 12
Issue: 6
ISSN: 0145-319X
Subject Category
Electronic Systems
Report/Patent Number
NPO-16646
Accession Number
88B10331
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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