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RF Testing Of Microwave Integrated CircuitsFixtures and techniques are undergoing development. Four test fixtures and two advanced techniques developed in continuing efforts to improve RF characterization of MMIC's. Finline/waveguide test fixture developed to test submodules of 30-GHz monolithic receiver. Universal commercially-manufactured coaxial test fixture modified to enable characterization of various microwave solid-state devices in frequency range of 26.5 to 40 GHz. Probe/waveguide fixture is compact, simple, and designed for non destructive testing of large number of MMIC's. Nondestructive-testing fixture includes cosine-tapered ridge, to match impedance wavequide to microstrip. Advanced technique is microwave-wafer probing. Second advanced technique is electro-optical sampling.
Document ID
19880000359
Document Type
Other - NASA Tech Brief
Authors
Romanofsky, R. R. (NASA Lewis Research Center, Cleveland, Ohio.)
Ponchak, G. E. (NASA Lewis Research Center, Cleveland, Ohio.)
Shalkhauser, K. A. (NASA Lewis Research Center, Cleveland, Ohio.)
Bhasin, K. B. (NASA Lewis Research Center, Cleveland, Ohio.)
Date Acquired
August 13, 2013
Publication Date
July 1, 1988
Publication Information
Publication: NASA Tech Briefs
Volume: 12
Issue: 7
ISSN: 0145-319X
Subject Category
ELECTRONIC COMPONENTS AND CIRCUITS
Report/Patent Number
LEW-14639
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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