NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Radio-Frequency Strain MonitorRadio-frequency (RF) strain monitor developed to measure lengths of objects. RF waveguide or cable bonded to structure monitored. Propagation of RF signal along waveguide results in phase shift proportional to length of path traveled. Impedance mismatches placed in RF cable at nodes of structure. Records mismatches and detects overall length of line and lengths of intervals between nodes. Used to detect changes in elements of large structure with single cable. Monitor has potential for many applications, including monitoring stability of such large structures as aircraft, bridges, and buildings in Earthquake zones.
Document ID
19880000462
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Heyman, Joseph S.
(NASA Langley Research Center, Hampton, Va.)
Rogowski, Robert S.
(NASA Langley Research Center, Hampton, Va.)
Holben, Milford S., Jr.
(PRC Kentron, Inc.)
Date Acquired
August 13, 2013
Publication Date
October 1, 1988
Publication Information
Publication: NASA Tech Briefs
Volume: 12
Issue: 9
ISSN: 0145-319X
Subject Category
Electronic Systems
Report/Patent Number
LAR-13705
Accession Number
88B10462
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Available Downloads

There are no available downloads for this record.
No Preview Available