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Self-Testing Computer MemoryMemory system for computer repeatedly tests itself during brief, regular interruptions of normal processing of data. Detects and corrects transient faults as single-event upsets (changes in bits due to ionizing radiation) within milliseconds after occuring. Self-testing concept surpasses conventional by actively flushing latent defects out of memory and attempting to correct before accumulating beyond capacity for self-correction or detection. Cost of improvement modest increase in complexity of circuitry and operating time.
Document ID
19880000518
Document Type
Other - NASA Tech Brief
Authors
Chau, Savio, N. (Caltech)
Rennels, David A. (Caltech)
Date Acquired
August 13, 2013
Publication Date
November 1, 1988
Publication Information
Publication: NASA Tech Briefs
Volume: 12
Issue: 10
ISSN: 0145-319X
Subject Category
ELECTRONIC SYSTEMS
Report/Patent Number
NPO-16850
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.