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mounting thin samples for electrical measurementsNew method for mounting thin sample for electrical measurements involves use of vacuum chuck to hold a ceramic mounting plate, which holds sample. Contacts on mounting plate establish electrical connection to sample. Used to make electrical measurements over temperature range from 77 to 1,000 K and does not introduce distortions into magnetic field during Hall measurements.
Document ID
19880000522
Document Type
Other - NASA Tech Brief
Authors
Matus, L. G.
(NASA Lewis Research Center, Cleveland, OH.)
Summers, R. L.
(NASA Lewis Research Center, Cleveland, OH.)
Date Acquired
August 13, 2013
Publication Date
November 1, 1988
Publication Information
Publication: NASA Tech Briefs
Volume: 12
Issue: 10
ISSN: 0145-319X
Subject Category
PHYSICAL SCIENCES
Report/Patent Number
LEW-14646
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.