NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
X-Ray-Scattering Measurements Of Strain In PEEKInternal stress relieved by heating above glass-transition temperature. Report describes wide-angle x-ray scattering and differential scanning calorimetry of specimens of poly(etheretherketone) having undergone various thermal treatments. Wide-angle x-ray scattering particularly useful in determining distances between atoms, crystallinity, and related microstructurally generated phenomena, as thermal expansion and strain. Calorimetric measurements aid interpretation of scattering measurements by enabling correlation with thermal effects.
Document ID
19880000581
Document Type
Other - NASA Tech Brief
Authors
Cebe, Peggy (Caltech)
Lowry, Lynn E. (Caltech)
Chung, Shirley Y. (Caltech)
Yavrouian, Andre H. (Caltech)
Gupta, Amitava (Caltech)
Date Acquired
August 13, 2013
Publication Date
December 1, 1988
Publication Information
Publication: NASA Tech Briefs
Volume: 12
Issue: 11
ISSN: 0145-319X
Subject Category
PHYSICAL SCIENCES
Report/Patent Number
NPO-17097
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.