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Question on the measurement of the metal work function in an electron spectrometer by the secondary-electron emission threshold methodThe feasibility of measuring metal work functions using the secondary emission threshold method and an electron spectrometer is demonstrated. Measurements are reported for Nb, Mo, Ta, and W bombarded by Ar(+) ions.
Document ID
19880013595
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Alov, N. V.
(NASA Headquarters Washington, DC United States)
Dadayan, K. A.
(NASA Headquarters Washington, DC United States)
Date Acquired
September 5, 2013
Publication Date
April 1, 1988
Subject Category
Metallic Materials
Report/Patent Number
NAS 1.77:20190
NASA-TT-20190
Accession Number
88N22979
Funding Number(s)
CONTRACT_GRANT: NASW-4307
Distribution Limits
Public
Copyright
Public Use Permitted.
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