Surface evaluation of the grazing incidence mirrors for the Extreme Ultraviolet ExplorerThe EUV scattering from the Wolter-Schwarzschild type I short wavelength scanner mirror aboard the Extreme Ultraviolet Explorer is measured, and the results are used to evaluate the surface microroughness of the mirror. It is found that the most likely values for the mirror surface are sigma = 20 A, and rho = 40 microns. These results are consistent with previous estimates, but with a higher degree of certainty. The full-scale simulation presented here allows over 99 percent of the light distribution to be reasonably modeled.
Document ID
19880032904
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Green, James (California Univ. Berkeley, CA, United States)
Finley, David S. (California Univ. Berkeley, CA, United States)
Bowyer, Stuart (California Univ. Berkeley, CA, United States)
Malina, Roger F. (California, University Berkeley, United States)