Spatial profile of thermoelectric effects during Peltier pulsing in Bi and Bi/MnBi eutecticThe spatial profile of the thermal transients that occur during and following the current pulsing associated with Peltier Interface Demarcation during directional solidification is studied. Results for pure Bi are presented in detail and compared with corresponding results for the Bi/MnBi eutectic. Significant thermal transients occur throughout the sample that can be accounted for by the Peltier effect, the Thomson effect, and Joule heating. These effects are separated and their behavior is studied as a function of time, current density, and position with respect to the solid/liquid interface.
Document ID
19880041339
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Silberstein, R. P. (Grumman Aerospace Corp. Bethpage, NY, United States)
Larson, D. J., Jr. (Grumman Corporate Research Center Bethpage, NY, United States)
Date Acquired
August 13, 2013
Publication Date
January 1, 1987
Subject Category
Materials Processing
Meeting Information
Meeting: Materials processing in the reduced gravity environment of space