Single event upset (SEU) testing at JPLIt is believed that the increase in SEUs with more modern devices may have serious consequences for future space missions. The physics behind an SEU is discussed as well as SEU test philosophy and equipment, and testing results. It is concluded that the problem may be ameliorated by careful device selection and the use of redundancy or error correction.
Document ID
19880046559
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Coss, James R. (California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)