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Measurement of minority carrier lifetimes and surface recombination velocities in solar cellsA generic comparison has been carried out of all methods for recombination parameter determination that are based on measurement of a current and/or voltage in either steady-state, transient, or frequency-dependent approaches. The theoretical background for the time-dependent methods has been extended from prior work to include drift fields and be applicable to compound (multilayered) regions. The key findings were: (1) all methods have essentially the same limitations to determination of only the dominant recombination parameters; (2) open-circuit measurements have more sensitivity to the recombination parameters than short circuit measurements, but they present much more difficulty in eliminating spurious effects; (3) transient and frequency-dependent methods have exactly the same expressions for the relaxation constants and the breakpoint frequencies; and (4) in compound regions there exists only one set of relaxation constants for all the coupled layers. These constants include all relevant parameters of these layers. It is thus difficult to separate these parameters in time- or frequency-domain measurements. ASLBIC seems still to be the most suitable method for determination of emitter parameters.
Document ID
19880047185
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Wolf, M.
(Pennsylvania Univ. Philadelphia, PA, United States)
Newhouse, M.
(Pennsylvania, University Philadelphia, United States)
Date Acquired
August 13, 2013
Publication Date
January 1, 1987
Subject Category
Solid-State Physics
Meeting Information
Meeting: IEEE Photovoltaic Specialists Conference
Location: New Orleans, LA
Country: United States
Start Date: May 4, 1987
End Date: May 8, 1987
Accession Number
88A34412
Funding Number(s)
CONTRACT_GRANT: JPL-956290
Distribution Limits
Public
Copyright
Other

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