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Hot-spot qualification testing of concentrator modulesResults of a study to determine the hot-spot susceptibility of concentrator cells, to provide a hot-spot qualification test for concentrator modules, and to provide guidelines for reducing hot-spot susceptibility are presented. Hot-spot heating occurs in a photovoltaic module when the short-circuit current of a cell is lower than the string operating current, forcing the cell into reverse bias with a concurrent power dissipation. Although the basis for the concentrator-module hot-spot qualification test is the test developed for flat-plate modules, issues such as providing cell illumination introduce additional complexities into the testing procedure. The results indicate that the same general guidelines apply to protecting concentrator modules from hot-spot stressing as apply to flat-plate modules, and recommendations are made on the number of bypass diodes required per given number of series cells per module or source circuit. A method for determining the cell temperature in the laboratory or in the field is discussed.
Document ID
19880047207
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Gonzalez, C. C.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Sugimura, R. S.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Ross, R. G., Jr.
(California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Date Acquired
August 13, 2013
Publication Date
January 1, 1987
Subject Category
Energy Production And Conversion
Meeting Information
Meeting: IEEE Photovoltaic Specialists Conference
Location: New Orleans, LA
Country: United States
Start Date: May 4, 1987
End Date: May 8, 1987
Accession Number
88A34434
Distribution Limits
Public
Copyright
Other

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