Measurement of electron-attachment line shapes, cross sections, and rate constants in HI and DI at ultralow electron energies

Electron-attachment cross sections are reported in the electron energy range 0-150 MeV, at an energy resolution of 6.5 MeV (full width at half maximum) for the molecules HI and DI. Use is made of the Kr photoionization method to obtain cross sections for HI, and a signal intercomparison technique to obtain cross sections and the thermal-attachment rate constant for DI. Attachment properties of the two molecules are very similar. The ratio of attachment cross sections is discussed in terms of the reduced-mass dependence of the dissociation width and the survival probability, and in terms of spectroscopic thresholds and rotational populations for attachment at 300 K. Approximate potential-energy curves for the lowest states of the neutral molecule and negative ion are given.