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Measurement of Seebeck coefficient using a large thermal gradientThe integral method of measuring the Seebeck voltage, V(T), has been applied to short rod-shaped samples. In the present method, one end of the sample is held at a fixed temperature and the other end is automatically varied through a temperature T range of interest, up to a maximum temperature of 1000 C. The Seebeck coefficient is then obtained from the slope of the V(T) vs T curve. The method offers simplicity of sample handling and minimal operator involvement.
Document ID
19880054336
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Wood, C.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Chmielewski, A.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Zoltan, D.
(California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Date Acquired
August 13, 2013
Publication Date
June 1, 1988
Publication Information
Publication: Review of Scientific Instruments
Volume: 59
ISSN: 0034-6748
Subject Category
Instrumentation And Photography
Accession Number
88A41563
Distribution Limits
Public
Copyright
Other

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