Instrumentation and data acquisition electronics for free-flight drop model testingThis paper presents instrumentation and data acquisition electronics techniques used in free-flight drop model testing at the NASA Langley Research Center. Free-flight drop model testing is a technique for conducting complex aircraft controls research using reduced scale models of experimental aircraft. An introduction to the Free-Flight Drop Model Program is presented first. This is followed by a description of the recently upgraded airborne and ground based instrumentation and data acquisition electronics. Lastly current and future development efforts and opportunities are discussed.
Document ID
19880064690
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Carraway, Preston I., III (NASA Langley Research Center Hampton, VA, United States)