Deterioration of ZnO/SiO2 diode packages in high humidity

A case study is reported in which the ZnO/SiO2 glass used to package a power rectifier combined with the design to produce a catastropic corrosion failure of the system. Metallic Zn inclusions, present in the glass, played a critical role in creating a conductive path for corrosion currents. Actual equipment failure was the result of an open circuit trace created by corrosion. It is concluded that the presence of Zn inclusions in the glass of this type of package may result in long-term reliability problems for equipment used in high humidity environments.