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Testing Fixture For Microwave Integrated CircuitsTesting fixture facilitates radio-frequency characterization of microwave and millimeter-wave integrated circuits. Includes base onto which two cosine-tapered ridge waveguide-to-microstrip transitions fastened. Length and profile of taper determined analytically to provide maximum bandwidth and minimum insertion loss. Each cosine taper provides transformation from high impedance of waveguide to characteristic impedance of microstrip. Used in conjunction with automatic network analyzer to provide user with deembedded scattering parameters of device under test. Operates from 26.5 to 40.0 GHz, but operation extends to much higher frequencies.
Document ID
19890000008
Document Type
Other - NASA Tech Brief
Authors
Romanofsky, Robert (NASA Lewis Research Center, Cleveland, OH.)
Shalkhauser, Kurt (NASA Lewis Research Center, Cleveland, OH.)
Date Acquired
August 13, 2013
Publication Date
January 1, 1989
Publication Information
Publication: NASA Tech Briefs
Volume: 13
Issue: 1
ISSN: 0145-319X
Subject Category
ELECTRONIC COMPONENTS AND CIRCUITS
Report/Patent Number
LEW-14746
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.