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Trends In Susceptibility To Single-Event UpsetReport provides nearly comprehensive body of data on single-event upsets due to irradiation by heavy ions. Combines new test data and previously published data from governmental and industrial laboratories. Clear trends emerge from data useful in predicting future performances of devices.
Document ID
19890000009
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Nichols, Donald K. (Caltech)
Price, William E. (Caltech)
Kolasinski, Wojciech A. (The Aerospace Corp.)
Koga, Rukotaro (The Aerospace Corp.)
Waskiewicz, Alvin E. (Rockwell International Corp.)
Pickel, James C. (IRT Corp.)
Blandford, James T. (IRT Corp.)
Date Acquired
August 13, 2013
Publication Date
January 1, 1989
Publication Information
Publication: NASA Tech Briefs
Volume: 13
Issue: 1
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-17147
Accession Number
89B10009
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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