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The prediction and confirmation of critical epitaxial parametersThe coherency-incoherency transition in epitaxial crystals is said to take place at a critical misfit f(c) or, for a system in which a monolayer is subcritical, at a critical thickness h(c). In this paper, the physical principles and models used to predict critical parameters are analyzed and put into perspective. The dependence of the relevant principles on the equilibrium-nonequilibrium conditions under which the quantities are measured in practice is stressed. The advantages and disadvantages of the models used (essentially the Frenkel-Kontorowa and Volterra models) are highlighted.
Document ID
19890032662
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Van Der Merwe, Jan
(Pretoria Univ. South Africa)
Jesser, W. A.
(Pretoria, University Republic of South Africa, United States)
Date Acquired
August 14, 2013
Publication Date
November 15, 1988
Publication Information
Publication: Journal of Applied Physics
Volume: 64
ISSN: 0021-8979
Subject Category
Solid-State Physics
Accession Number
89A20033
Funding Number(s)
CONTRACT_GRANT: NAG1-350
Distribution Limits
Public
Copyright
Other

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