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The design of radiation-hardened ICs for space - A compendium of approachesSeveral technologies, including bulk and epi CMOS, CMOS/SOI-SOS (silicon-on-insulator-silicon-on-sapphire), CML (current-mode logic), ECL (emitter-coupled logic), analog bipolar (JI, single-poly DI, and SOI) and GaAs E/D (enhancement/depletion) heterojunction MESFET, are discussed. The discussion includes the direct effects of space radiation on microelectronic materials and devices, how these effects are evidenced in circuit and device design parameter variations, the particular effects of most significance to each functional class of circuit, specific techniques for hardening high-speed circuits, design examples for integrated systems, including operational amplifiers and A/D (analog/digital) converters, and the computer simulation of radiation effects on microelectronic ISs.
Document ID
19890035067
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Kerns, Sherra E.
(Vanderbilt University Nashville, TN, United States)
Shafer, B. D
(Sandia National Laboratories Albuquerque, NM, United States)
Rockett, L. R., Jr.
(IBM Corp. Manassas, VA, United States)
Pridmore, J. S.
(RCA Morristown, NJ, United States)
Berndt, D. F.
(Honeywell, Inc. Minneapolis, MN, United States)
Date Acquired
August 14, 2013
Publication Date
November 1, 1988
Publication Information
Publication: IEEE, Proceedings
Volume: 76
ISSN: 0018-9219
Subject Category
Electronics And Electrical Engineering
Accession Number
89A22438
Distribution Limits
Public
Copyright
Other

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