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Optical Detection Of Deformations Of An AntennaProposed control subsystem generates small aiming-bias signals to correct for deviations of 70-m-diameter reflector of microwave antenna from its ideal shape. Takes optical measurements to determine deformations produced by such environmental factors as wind, gravity, and thermal differentials. Using these measurements, subsystem estimates misalignment of radiation pattern caused by deformations. Signals to correct for estimated misalignment added to angle-command signals of main antenna-aiming system. To measure deviations laser ranging devices placed at base of feed on rigid intermediate reference structure, white retroreflectors placed on parts that deviate from assigned positions relative to intermediate reference structure.
Document ID
19900000211
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Schumacher, L. L.
(Caltech)
Vivian, H. C.
(Caltech)
Date Acquired
August 14, 2013
Publication Date
May 1, 1990
Publication Information
Publication: NASA Tech Briefs
Volume: 14
Issue: 5
ISSN: 0145-319X
Subject Category
Electronic Systems
Report/Patent Number
NPO-17677
Accession Number
90B10211
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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