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Electro-optical Probing Of Terahertz Integrated CircuitsElectro-optical probe developed to perform noncontact, nondestructive, and relatively noninvasive measurements of electric fields over broad spectrum at millimeter and shorter wavelengths in integrated circuits. Manipulated with conventional intregrated-circuit-wafer-probing equipment and operated without any special preparation of integrated circuits. Tip of probe small electro-optical crystal serving as proximity electric-field sensor.
Document ID
19900000387
Document Type
Other - NASA Tech Brief
Authors
Bhasin, K. B.
(NASA Lewis Research Center, Cleveland, OH.)
Romanofsky, R.
(NASA Lewis Research Center, Cleveland, OH.)
Whitaker, J. F.
(Michigan Univ.)
Valdmanis, J. A.
(Michigan Univ.)
Mourou, G.
(Michigan Univ.)
Jackson, T. A.
(Rochester Univ.)
Date Acquired
August 14, 2013
Publication Date
August 1, 1990
Publication Information
Publication: NASA Tech Briefs
Volume: 14
Issue: 8
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
LEW-14956
Accession Number
90B10387
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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