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Enhanced resolution particle size distributions by multiple angle photon correlation spectroscopyPhoton correlation spectroscopy (PCS) has become a method of choice for measuring submicrometer particles. It is capable of rapid, accurate measurements of mean particle size. Since the measurements are nonperturbing, it is ideal for monitoring systems undergoing dynamic changes. Despite its widespread acceptance, the information content of PCS measurements for particle size distributions is low and provides limited resolution. A method is presented whereby PCS measurements made at several scattering angles plus the angular distribution of light scattered from the particles are combined in a single simultaneous analysis to effect an enhanced resolution particle size distribution. The efficacy of the method is assessed by recovering size distributions from computer simulated data and by comparisons of conventional PCS measurements of polystyrene spheres with those made by the new method.
Document ID
19900007778
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Bott, Steven E.
(Coulter Electronics, Inc. Amherst, MA, United States)
Date Acquired
August 14, 2013
Publication Date
August 1, 1989
Publication Information
Publication: NASA, Lewis Research Center, NASA Laser Light Scattering Advanced Technology Development Workshop, 1988
Subject Category
Optics
Accession Number
90N17094
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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