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Measurement of small temperature fluctuations at high average temperatureBoth absolute and differential temperature measurements were simultaneously performed as a function of time for a pixel on a high-temperature, multi-spectral, spatially and temporally varying infrared target simulator. A scanning laser beam was used to maintain a pixel at an on-the-average constant temperature of 520 K. The laser refresh rate of up to 1 kHz resulted in small-amplitude temperature fluctuations with a peak-to-peak amplitude of less than 1 K. The experimental setup to accurately measure the differential and the absolute temperature as a function of time is described.
Document ID
19900023116
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Scholl, James W.
(Alenka Associates Tempe, AZ, United States)
Scholl, Marija S.
(California Institute of Technology Jet Propulsion Laboratory, Pasadena, United States)
Date Acquired
August 14, 2013
Publication Date
January 1, 1988
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: Infrared Technology XIV
Location: San Diego, CA
Country: United States
Start Date: August 15, 1988
End Date: August 17, 1988
Accession Number
90A10171
Distribution Limits
Public
Copyright
Other

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