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Record Details

Record 3 of 81290
Measurement of small temperature fluctuations at high average temperature
Author and Affiliation:
Scholl, James W.(Alenka Associates, Tempe, AZ, United States)
Scholl, Marija S.(California Institute of Technology, Jet Propulsion Laboratory, Pasadena, United States)
Abstract: Both absolute and differential temperature measurements were simultaneously performed as a function of time for a pixel on a high-temperature, multi-spectral, spatially and temporally varying infrared target simulator. A scanning laser beam was used to maintain a pixel at an on-the-average constant temperature of 520 K. The laser refresh rate of up to 1 kHz resulted in small-amplitude temperature fluctuations with a peak-to-peak amplitude of less than 1 K. The experimental setup to accurately measure the differential and the absolute temperature as a function of time is described.
Publication Date: Jan 01, 1988
Document ID:
19900023116
(Acquired Nov 28, 1995)
Accession Number: 90A10171
Subject Category: INSTRUMENTATION AND PHOTOGRAPHY
Document Type: Conference Paper
Publication Information: (SEE A90-10138)
Publisher Information: United States
Meeting Information: Infrared Technology XIV; Aug. 15-17, 1988; San Diego, CA; United States
Financial Sponsor: NASA; United States
Organization Source: Alenka Associates; Tempe, AZ, United States
Jet Propulsion Lab., California Inst. of Tech.; Pasadena, CA, United States
Description: 7p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: Copyright
NASA Terms: HIGH TEMPERATURE; INFRARED DETECTORS; LASER BEAMS; TARGET SIMULATORS; TEMPERATURE MEASURING INSTRUMENTS; TEMPERATURE PROFILES; GLASSY CARBON; PIXELS; TEMPERATURE GRADIENTS; THERMAL DIFFUSION
Imprint And Other Notes: IN: Infrared technology XIV; Proceedings of the Meeting, San Diego, CA, Aug. 15-17, 1988 (A90-10138 01-35). Bellingham, WA, Society of Photo-Optical Instrumentation Engineers, 1988, p. 409-415.
Availability Source: Other Sources
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