NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Image processing enhancement of high-resolution TEM micrographs of nanometer-size metal particlesThe high-resolution TEM detectability of lattice fringes from metal particles supported on substrates is impeded by the substrate itself. Single value decomposition (SVD) and Fourier filtering (FFT) methods were applied to standard high resolution micrographs to enhance lattice resolution from particles as well as from crystalline substrates. SVD produced good results for one direction of fringes, and it can be implemented as a real-time process. Fourier methods are independent of azimuthal directions and allow separation of particle lattice planes from those pertaining to the substrate, which makes it feasible to detect possible substrate distortions produced by the supported particle. This method, on the other hand, is more elaborate, requires more computer time than SVD and is, therefore, less likely to be used in real-time image processing applications.
Document ID
19900034853
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Artal, P.
(CSIC Instituto de Optica, Madrid, Spain)
Avalos-Borja, M.
(Stanford University CA, United States)
Soria, F.
(CSIC Instituto de Ciencia de Materiales, Madrid, Spain)
Poppa, H.
(IBM Almaden Research Center San Jose, CA, United States)
Heinemann, K.
(Eloret Institute Sunnyvale, CA, United States)
Date Acquired
August 14, 2013
Publication Date
January 1, 1989
Publication Information
Publication: Ultramicroscopy
Volume: 30
ISSN: 0304-3991
Subject Category
Instrumentation And Photography
Accession Number
90A21908
Funding Number(s)
CONTRACT_GRANT: NCC2-283
Distribution Limits
Public
Copyright
Other

Available Downloads

There are no available downloads for this record.
No Preview Available