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Ballistic electron emission microscopy and spectroscopy of Au/GaAs interfacesThis paper presents the first Schottky barrier results for the Au/GaAs(100) interface prepared completely in situ on GaAs grown by molecular-beam epitaxy. The resulting interface displays unexpected properties which can be interpreted in terms of enhanced electrode interdiffusion. In addition, the capability of molecular-beam epitaxy for in situ processing enables the stabilization of this interface against diffusion and allows the formation of a Au/GaAs system with nearly ideal properties. Newly developed ballistic electron spectroscopy and imaging techniques demonstrate that the heterogeneity present at the interface of Au/GaAs(100) fabricated on chemically treated GaAs substrates is removed.
Document ID
19900036964
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Kaiser, W. J.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Bell, L. D.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Hecht, M. H.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Grunthaner, F. J.
(JPL Pasadena, CA, United States)
Date Acquired
August 14, 2013
Publication Date
August 1, 1989
Publication Information
Publication: Journal of Vacuum Science and Technology B
Volume: 7
ISSN: 0734-211X
Subject Category
Solid-State Physics
Report/Patent Number
ISSN: 0734-211X
Accession Number
90A24019
Distribution Limits
Public
Copyright
Other

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