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Design of a normal incidence multilayer imaging X-ray microscopeNormal incidence multilayer Cassegrain X-ray telescopes were flown on the Stanford/MSFC Rocket X-ray Spectroheliograph. These instruments produced high spatial resolution images of the sun and conclusively demonstrated that doubly reflecting multilayer X-ray optical systems are feasible. The images indicated that aplanatic imaging soft X-ray/EUV microscopes should be achievable using multilayer optics technology. A doubly reflecting normal incidence multilayer imaging X-ray microscope based on the Schwarzschild configuration has been designed. The design of the microscope and the results of the optical system ray trace analysis are discussed. High resolution aplanatic imaging X-ray microscopes using normal incidence multilayer X-ray mirrors should have many important applications in advanced X-ray astronomical instrumentation, X-ray lithography, biological, biomedical, metallurgical, and laser fusion research.
Document ID
19900051927
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Shealy, David L.
(Alabama Univ. Birmingham, AL, United States)
Gabardi, David R.
(Alabama, University Birmingham, United States)
Hoover, Richard B.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Walker, Arthur B. C., Jr.
(Alabama Univ. Birmingham, AL, United States)
Lindblom, Joakim F.
(Stanford University CA, United States)
Date Acquired
August 14, 2013
Publication Date
January 1, 1989
Publication Information
Publication: Journal of X-Ray Science and Technology
Volume: 1
ISSN: 0895-3996
Subject Category
Instrumentation And Photography
Accession Number
90A38982
Funding Number(s)
CONTRACT_GRANT: NSG-5131
Distribution Limits
Public
Copyright
Other

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