Design and analysis of a Schwarzschild imaging multilayer X-ray microscope

Several Schwarzschild X-ray microscope optics were designed. Diffraction analysis indicates that better than 600 A spatial resolution in the object plane up to a 0.7 mm field of view can be achieved with 100 A radiation. Currently, a 20 x normal incidence multilayer X-ray microscope of 1.35 m overall length is being fabricated. Other microscope systems for use in conjunction with X-ray telescopes were also analyzed and designed. This paper reports on the results of these studies and the X-ray microscope fabrication effort.