Development of a normal incidence multilayer, imaging X-ray microscopeThis paper describes the design, analysis, and fabrication of a normal-incidence multilayer 20x Schwarzschild imaging X-ray microscope. The microscope is being fabricated using much of the technology implemented in the Multispectral Solar Telescope Array. Results of diffraction analysis show that better than 400 A spatial resolution in the object plane up to a 1-mm field of view can be achieved with 125 A radiation. Other microscope systems for use in conjunction with X-ray telescopes are analyzed and designed.
Document ID
19900058956
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Shealy, David L. (Alabama, University Birmingham, United States)
Hoover, Richard B. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Walker, Arthur B. C., Jr. (Stanford University CA, United States)
Barbee, Troy W., Jr. (Lawrence Livermore National Laboratory Livermore, CA, United States)
Date Acquired
August 14, 2013
Publication Date
January 1, 1989
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: X-ray/EUV Optics for Astronomy and Microscopy