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Study of the polarization dependence of the photoelectric effect in the soft X-ray band - A focal plane photoelectric stellar X-ray polarimeter for the Spectrum-X-Gamma missionAn experimental study of the polarization dependence of the photoelectric effect in cesium iodide in the soft X-ray band was started (Heckler et al., 1989). At a grazing angle of 10 degrees and a photon energy of 2.6 keV, it is found that the photoelectric yield from a thin layer of evaporated cesium iodide varies by 12.4 percent as the polarization vector of the incident X-ray beam is rotated about the line-of-sight. The rotation angle corresponding to the maximum photoyield is displaced by 16 degrees from the normal to the photocathode. This modulation and phase shift are in good agreement with the results recently reported by Fraser, et al. (1989) It is shown that a focal plane stellar X-ray polarimeter based on this photoelectric effect will be substantially more efficient than convential X-ray polarimeters such as those based on either Bragg reflection or scattering from low atomic number targets.
Document ID
19900058974
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Heckler, A.
(Columbia Univ. New York, NY, United States)
Blaer, A.
(Columbia Univ. New York, NY, United States)
Kaaret, P.
(Columbia Univ. New York, NY, United States)
Novick, R.
(Columbia University New York, United States)
Date Acquired
August 14, 2013
Publication Date
January 1, 1989
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: X-ray/EUV Optics for Astronomy and Microscopy
Location: San Diego, CA
Country: United States
Start Date: August 7, 1989
End Date: August 11, 1989
Sponsors: JPL, New Mexico State Univ., SPIE
Accession Number
90A46029
Funding Number(s)
CONTRACT_GRANT: NAG5-618
Distribution Limits
Public
Copyright
Other

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