Flat field response of the microchannel plate detectors used on the Extreme Ultraviolet Explorer

The results of the extreme ultraviolet (EUV) flat field calibrations of two of the flight detectors to be flown on the Extreme Ultraviolet Explorer Satellite (EUVE) are presented. Images of about 40 million detected events binned 512 by 512 are sufficient to show microchannel plate fixed pattern noise such as hexagonal microchannel multifiber bundle interfaces, 'dead' spots, edge distortion, and differential nonlinearity. Differences due to photocathode material and dependencies on EUV wavelength are also described. Over large spatial scales, the detector response is flat to better than 10 percent of the mean response, but, at spatial scales less than 1 mm, the variations from the mean can be as large as 20 percent.