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Self-Testing Static Random-Access MemoryProposed static random-access memory for computer features improved error-detecting and -correcting capabilities. New self-testing scheme provides for detection and correction of errors at any time during normal operation - even while data being written into memory. Faults in equipment causing errors in output data detected by repeatedly testing every memory cell to determine whether it can still store both "one" and "zero", without destroying data stored in memory.
Document ID
19910000040
Document Type
Other - NASA Tech Brief
Authors
Chau, Savio (Caltech)
Rennels, David (Caltech)
Date Acquired
August 14, 2013
Publication Date
February 1, 1991
Publication Information
Publication: NASA Tech Briefs
Volume: 15
Issue: 2
ISSN: 0145-319X
Subject Category
ELECTRONIC SYSTEMS
Report/Patent Number
NPO-17939
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.