NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Cross-Quint-Bridge ResistorIntegrated-circuit conductive test pattern intended to provide data on effects of design widths and design spacings upon actual widths of conductive lines. Provides for electrical measurements both on lines of unknown width and on features having known dimensions. Data from measurements on five bridges used to determine four parameters of mathematical model describing system. In principle, pattern determines effects of width and spacing and interaction between them.
Document ID
19910000239
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Hannaman, David J.
(Caltech)
Lieneweg, Udo
(Caltech)
Buehler, Martin G.
(Caltech)
Mantalas, Linda
(Prometrix Corp.)
Date Acquired
August 14, 2013
Publication Date
June 1, 1991
Publication Information
Publication: NASA Tech Briefs
Volume: 15
Issue: 6
ISSN: 0145-319X
Subject Category
Electronic Components And Circuits
Report/Patent Number
NPO-18106
Accession Number
91B10239
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Available Downloads

There are no available downloads for this record.
No Preview Available