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Linear ion trap for second-order Doppler shift reduction in frequency standard applicationsThe authors have designed and are presently testing a novel linear ion trap that permits storage of a large number of ions with reduced susceptibility to the second-order Doppler effect caused by the RF confining fields. This new trap should store about 20 times the number of ions as a conventional RF trap with no corresponding increase in second-order Doppler shift from the confining field. In addition, the sensitivity of this shift to trapping parameters, i.e., RF voltage, RF frequency, and trap size, is greatly reduced. The authors have succeeded in trapping mercury ions and xenon ions in the presence of helium buffer gas. Trap times as long as 2000 s have been measured.
Document ID
19910033341
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
External Source(s)
Authors
Prestage, John D.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Janik, Gary R.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Dick, G. John
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Maleki, Lute
(JPL Pasadena, CA, United States)
Date Acquired
August 15, 2013
Publication Date
November 1, 1990
Publication Information
Publication: IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume: 37
ISSN: 0885-3010
Subject Category
Atomic And Molecular Physics
Accession Number
91A17964
Distribution Limits
Public
Copyright
Other

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