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The structure of carbon in chemically vapor deposited SiC monofilamentsElectron diffraction and high resolution TEM have been used to study the microstructures of C-rich regions in CVD SCS-6 SiC fibers. The reciprocal lattice of such structures, and their diffraction patterns, have been ascertained on the basis of geometrical considerations. While the C microstructures in the substrate filament and the outer coating layers of the fabric are consistent with different distributions of Oberlin's (1989) 'basic structural units', the microstructure of the inner substrate coating is consistent with turbostratic C.
Document ID
19910034052
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Ning, X. J.
(Case Western Reserve Univ. Cleveland, OH, United States)
Pirouz, P.
(Case Western Reserve Univ. Cleveland, OH, United States)
Lagerlof, K. P. D.
(Case Western Reserve University Cleveland, OH, United States)
Dicarlo, J.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
August 15, 2013
Publication Date
December 1, 1990
Publication Information
Publication: Journal of Materials Research
Volume: 5
ISSN: 0884-2914
Subject Category
Nonmetallic Materials
Accession Number
91A18675
Funding Number(s)
CONTRACT_GRANT: NCC3-73
Distribution Limits
Public
Copyright
Other

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