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Study of electron impact excitation of argon in the extreme ultraviolet - Emission cross section of resonance lines of Ar I, Ar IIIn a crossed-beam experiment under optically thin conditions the EUV spectrum of argon produced by electron impact excitation is studied. The cross sections of the resonance lines of Ar I and II are measured. The resonance lines of Ar I at 104.8 nm and 106.7 nm, and of Ar II at 91.96 nm and 93.21 nm are the most prominent features of the EUV spectrum between 40 and 110 nm. The relative-flow technique is used to measure the absolute cross sections of these lines at 200 eV. The measurements are compared with previous estimates. The measured emission cross section values at 200 eV for the Ar I lines at 104.8 nm and 106.7 nm, when compared to the electron energy loss estimates of the direct excitation cross sections, establish that cascading is larger for the Ar I resonance lines than previous emission experiments have indicated. In addition, all the emission cross sections for the Ar I and II Rydberg series in the EUV are measured at 0.5 nm resolution. The FUV spectrum is also surveyed and found to consist of Ar II multiplets from simultaneous ionization-excitation.
Document ID
19910037119
Acquisition Source
Legacy CDMS
Document Type
Reprint (Version printed in journal)
Authors
Ajello, Joseph M.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
James, Geoffrey K.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Franklin, Brian
(JPL Pasadena, CA, United States)
Howell, Simon
(Manchester, Victoria University United Kingdom)
Date Acquired
August 15, 2013
Publication Date
December 14, 1990
Publication Information
Publication: Journal of Physics B - Atomic, Molecular and Optical Physics
Volume: 23
ISSN: 0953-4075
Subject Category
Atomic And Molecular Physics
Accession Number
91A21742
Funding Number(s)
CONTRACT_GRANT: NSF ATM-87-15709
CONTRACT_GRANT: NAS7-100
Distribution Limits
Public
Copyright
Other

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